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Device characteristics of ultra-shallow junctions formed by fRTP annealing
Publication:
Device characteristics of ultra-shallow junctions formed by fRTP annealing
Date
2004
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Satta, Alessandra
;
Lindsay, Richard
;
Severi, Simone
;
Henson, Kirklen
;
Maex, Karen
;
McCoy, S.
;
Gelpey, J.
;
Elliott, K.
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1914
since deposited on 2021-10-15
Acq. date: 2025-10-22
Citations
Metrics
Views
1914
since deposited on 2021-10-15
Acq. date: 2025-10-22
Citations