Publication:
Atom probe tomography analysis of SiGe fins embedded in SiO2: facts and artefacts
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2018 since deposited on 2021-10-24
6last month
1last week
Acq. date: 2026-01-11
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Views
2018 since deposited on 2021-10-24
6last month
1last week
Acq. date: 2026-01-11
Citations