Publication:
Atom probe tomography analysis of SiGe fins embedded in SiO2: facts and artefacts
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2012 since deposited on 2021-10-24
2last month
Acq. date: 2025-12-09
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Metrics
Views
2012 since deposited on 2021-10-24
2last month
Acq. date: 2025-12-09
Citations