Publication:
Positive bias temperature instability in nMOSFETs with ultra-thin Hf-silicate gate dielectrics
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1967 since deposited on 2021-10-16
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Acq. date: 2026-08-10
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Statistics
Views
1967 since deposited on 2021-10-16
1last month
1last week
Acq. date: 2026-08-10
Citations