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Single-event induced charge collection in Ge-channel pMos FinFETs

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dc.contributor.authorRony, M.W.
dc.contributor.authorSamsel, Isaak
dc.contributor.authorZhang, En Xia
dc.contributor.authorSternberg, Andrew
dc.contributor.authorLi, Kan
dc.contributor.authorReaz, Mahumed
dc.contributor.authorAustin, Stephanie
dc.contributor.authorReed, Robert
dc.contributor.authorFleetwood, Robert
dc.contributor.authorAlles, Mike
dc.contributor.authorLinten, Dimitri
dc.contributor.authorMitard, Jerome
dc.contributor.authorSchrimpf, Ronald
dc.contributor.imecauthorLinten, Dimitri
dc.contributor.imecauthorMitard, Jerome
dc.contributor.orcidimecLinten, Dimitri::0000-0001-8434-1838
dc.contributor.orcidimecMitard, Jerome::0000-0002-7422-079X
dc.date.accessioned2021-10-29T03:15:03Z
dc.date.available2021-10-29T03:15:03Z
dc.date.embargo9999-12-31
dc.date.issued2020-07
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/35854
dc.identifier.urlhttp://www.nsrec.com/2020_session-e.html
dc.source.beginpageE-1
dc.source.conferenceNuclear & Space Radiation Effects Conference - NSREC
dc.source.conferencedate1/12/2020
dc.source.conferencelocationVirtual USA
dc.title

Single-event induced charge collection in Ge-channel pMos FinFETs

dc.typeProceedings paper
dspace.entity.typePublication
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