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Impact of the environmental conditions on the electrical characteristics of scanning spreading resistance microscopy
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Impact of the environmental conditions on the electrical characteristics of scanning spreading resistance microscopy
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Date
2008
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Eyben, Pierre
;
Mody, Jay
;
Vemula, Sri Charan
;
Vandervorst, Wilfried
Journal
Journal of Vacuum Science and Technology B
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1838
since deposited on 2021-10-17
Acq. date: 2025-12-12
Citations
Metrics
Views
1838
since deposited on 2021-10-17
Acq. date: 2025-12-12
Citations