Publication:

Profiling of border traps at GeSn and high-K oxide interface

Date

2014

Meeting abstract

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Author(s)

;

;

;

Vrielinck, Henk

;

Lauwaert, Johan

;

Merckling, Clement

;

Gencarelli, Federica

;

Shimura, Yosuke

;

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Statistics

1900 since deposited on 2021-10-22

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Acq. date: 2026-01-25