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Channel and gate stack charge trapping investigation in vertical 3D NAND devices with poly-silicon channel
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Channel and gate stack charge trapping investigation in vertical 3D NAND devices with poly-silicon channel
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Date
2017
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Subirats, Alexandre
;
Arreghini, Antonio
;
Breuil, Laurent
;
Degraeve, Robin
;
Van den Bosch, Geert
;
Linten, Dimitri
;
Furnemont, Arnaud
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1966
since deposited on 2021-10-24
1
last month
Acq. date: 2025-12-10
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Metrics
Views
1966
since deposited on 2021-10-24
1
last month
Acq. date: 2025-12-10
Citations