Publication:

Joint reconstruction of attenuation, refraction and dark field X-ray phase contrasts using split Barzilai-Borwein steps

Date

 
dc.contributor.authorSix, Nathanael
dc.contributor.authorRenders, Jens
dc.contributor.authorDe Beenhouwer, Jan
dc.contributor.authorSijbers, Jan
dc.contributor.imecauthorSix, Nathanael
dc.contributor.imecauthorRenders, Jens
dc.contributor.imecauthorDe Beenhouwer, Jan
dc.contributor.imecauthorSijbers, Jan
dc.contributor.orcidimecSix, Nathanael::0000-0002-6207-481X
dc.contributor.orcidimecRenders, Jens::0000-0003-4327-7328
dc.contributor.orcidimecDe Beenhouwer, Jan::0000-0001-5253-1274
dc.contributor.orcidimecSijbers, Jan::0000-0003-4225-2487
dc.date.accessioned2023-06-05T15:07:20Z
dc.date.available2023-02-16T03:20:13Z
dc.date.available2023-06-05T15:07:20Z
dc.date.issued2022
dc.description.wosFundingTextNathanael Six and Jens Renders have PhD fellowships of the FWO, (11D8319N) and (1SA2920N), respectively. This research was also supported by EU Interreg Flanders -Netherlands Smart*Light (0386), and the Research Foundation -Flanders (G090020N, G094320N, S003421N).
dc.identifier.doi10.1117/12.2633587
dc.identifier.eisbn978-1-5106-5469-3
dc.identifier.issn0277-786X
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/41107
dc.publisherSPIE-INT SOC OPTICAL ENGINEERING
dc.source.beginpage122420O
dc.source.conferenceSPIE's Conference on Developments in X-Ray Tomography XIV
dc.source.conferencedateAUG 22-24, 2022
dc.source.conferencelocationSan Diego
dc.source.journalProceedings of SPIE
dc.source.numberofpages6
dc.source.volume12242
dc.subject.keywordsTOMOGRAPHY
dc.title

Joint reconstruction of attenuation, refraction and dark field X-ray phase contrasts using split Barzilai-Borwein steps

dc.typeProceedings paper
dspace.entity.typePublication
Files
Publication available in collections: