Publication:

Optimizing YOLOv7 for Semiconductor Defect Detection

Date

2023

Proceedings Paper

https://doi.org/10.1117/12.2657564

Simple item page Full metadata Statistics

Author(s)

Dehaerne, Enrique

;

Dey, Bappaditya

;

;

De Gendt, Stefan

Journal

Proceedings of SPIE

Statistics

836 since deposited on 2023-07-28

Acq. date: 2026-02-26