Publication:

Optimizing YOLOv7 for Semiconductor Defect Detection

Date

2023

Proceedings Paper

https://doi.org/10.1117/12.2657564

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Author(s)

Dehaerne, Enrique

;

Dey, Bappaditya

;

;

De Gendt, Stefan

Journal

Proceedings of SPIE

Metrics

835 since deposited on 2023-07-28

3last month

Acq. date: 2025-12-15