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Electromigration Mechanisms in Scaled Interconnects

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dc.contributor.authorBeyne, Sofie
dc.contributor.imecauthorBeyne, Sofie
dc.contributor.thesisadvisorDe Wolf, Ingrid
dc.contributor.thesisadvisorVerlinden, A.
dc.date.accessioned2021-10-27T07:33:49Z
dc.date.available2021-10-27T07:33:49Z
dc.date.embargo9999-12-31
dc.date.issued2019-09
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/32534
dc.title

Electromigration Mechanisms in Scaled Interconnects

dc.typePHD thesis
dspace.entity.typePublication
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