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A Ring-Oscillator-Based Degradation Monitor Concept with Tamper Detection Capability

 
dc.contributor.authorDiaz Fortuny, Javier
dc.contributor.authorSaraza Canflanca, Pablo
dc.contributor.authorBury, Erik
dc.contributor.authorVandemaele, Michiel
dc.contributor.authorKaczer, Ben
dc.contributor.authorDegraeve, Robin
dc.contributor.imecauthorDiaz Fortuny, Javier
dc.contributor.imecauthorSaraza Canflanca, Pablo
dc.contributor.imecauthorBury, Erik
dc.contributor.imecauthorVandemaele, Michiel
dc.contributor.imecauthorKaczer, Ben
dc.contributor.imecauthorDegraeve, Robin
dc.contributor.orcidimecBury, Erik::0000-0002-5847-3949
dc.contributor.orcidimecVandemaele, Michiel::0000-0003-0740-4115
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.contributor.orcidimecDiaz Fortuny, Javier::0000-0002-8186-071X
dc.contributor.orcidimecSaraza Canflanca, Pablo::0000-0003-2155-8305
dc.date.accessioned2023-04-20T09:55:47Z
dc.date.available2023-02-27T03:28:07Z
dc.date.available2023-04-20T09:55:47Z
dc.date.issued2022
dc.identifier.doi10.1109/IRPS48227.2022.9764609
dc.identifier.eisbn978-1-6654-7950-9
dc.identifier.issn1541-7026
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/41165
dc.publisherIEEE
dc.source.conferenceIEEE International Reliability Physics Symposium (IRPS)
dc.source.conferencedateMAR 27-31, 2022
dc.source.conferencelocationDallas
dc.source.journalna
dc.source.numberofpages7
dc.subject.keywordsBTI
dc.subject.keywordsCIRCUITS
dc.title

A Ring-Oscillator-Based Degradation Monitor Concept with Tamper Detection Capability

dc.typeProceedings paper
dspace.entity.typePublication
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