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Static and low frequency noise characterization of n-channel 16nm UTBOX devices
Publication:
Static and low frequency noise characterization of n-channel 16nm UTBOX devices
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Date
2016
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Nafaa, B.
;
Ismail, N.
;
Touayar, O.
;
Cretu, B.
;
Simoen, Eddy
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1893
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Acq. date: 2025-12-12
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Metrics
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1893
since deposited on 2021-10-23
1
last month
Acq. date: 2025-12-12
Citations