Publication:
A CDU comparison of double-patterning process options using Monte Carlo simulation
Date
| dc.contributor.author | Hooge, Joshua | |
| dc.contributor.author | Hatakeyama, Shinichi | |
| dc.contributor.author | Nafus, Kathleen | |
| dc.contributor.author | Scheer, Steven | |
| dc.contributor.author | Foubert, Philippe | |
| dc.contributor.author | Cheng, Shaunee | |
| dc.contributor.author | Leray, Philippe | |
| dc.contributor.imecauthor | Nafus, Kathleen | |
| dc.contributor.imecauthor | Scheer, Steven | |
| dc.contributor.imecauthor | Foubert, Philippe | |
| dc.contributor.imecauthor | Leray, Philippe | |
| dc.date.accessioned | 2021-10-17T22:56:56Z | |
| dc.date.available | 2021-10-17T22:56:56Z | |
| dc.date.embargo | 9999-12-31 | |
| dc.date.issued | 2009 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/15486 | |
| dc.source.beginpage | 72741U | |
| dc.source.conference | Optical Microlithography XXII | |
| dc.source.conferencedate | 22/02/2009 | |
| dc.source.conferencelocation | San Jose, CA USA | |
| dc.title | A CDU comparison of double-patterning process options using Monte Carlo simulation | |
| dc.type | Proceedings paper | |
| dspace.entity.type | Publication | |
| Files | Original bundle
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| Publication available in collections: |