Publication:
Investigation of OLED characteristics evolution under sequential photolithography patterning processes
Date
| dc.contributor.author | Ke, Tung Huei | |
| dc.contributor.author | Malinowski, Pawel | |
| dc.contributor.author | Nakamura, Atsushi | |
| dc.contributor.author | Vander Velpen, Dieter | |
| dc.contributor.author | Vandenplas, Erwin | |
| dc.contributor.author | Heremans, Paul | |
| dc.contributor.imecauthor | Ke, Tung Huei | |
| dc.contributor.imecauthor | Malinowski, Pawel | |
| dc.contributor.imecauthor | Vandenplas, Erwin | |
| dc.contributor.imecauthor | Heremans, Paul | |
| dc.contributor.orcidimec | Ke, Tung Huei::0000-0001-8381-4998 | |
| dc.contributor.orcidimec | Malinowski, Pawel::0000-0002-2934-470X | |
| dc.contributor.orcidimec | Heremans, Paul::0000-0003-2151-1718 | |
| dc.date.accessioned | 2021-10-25T20:50:56Z | |
| dc.date.available | 2021-10-25T20:50:56Z | |
| dc.date.issued | 2018 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/31031 | |
| dc.source.conference | 18th International Meeting on Information Display - IMID | |
| dc.source.conferencedate | 28/08/2018 | |
| dc.source.conferencelocation | Busan Korea | |
| dc.title | Investigation of OLED characteristics evolution under sequential photolithography patterning processes | |
| dc.type | Oral presentation | |
| dspace.entity.type | Publication | |
| Files | ||
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