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A first-principles study of the structural and electronic properties of III-V/thermal oxide interfaces

Date

2009
Journal article
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dc.contributor.authorScarrozza, Marco
dc.contributor.authorPourtois, Geoffrey
dc.contributor.authorHoussa, Michel
dc.contributor.authorCaymax, Matty
dc.contributor.authorStesmans, Andre
dc.contributor.authorMeuris, Marc
dc.contributor.authorHeyns, Marc
dc.contributor.imecauthorPourtois, Geoffrey
dc.contributor.imecauthorHoussa, Michel
dc.contributor.imecauthorCaymax, Matty
dc.contributor.imecauthorStesmans, Andre
dc.contributor.imecauthorMeuris, Marc
dc.contributor.imecauthorHeyns, Marc
dc.contributor.orcidimecPourtois, Geoffrey::0000-0003-2597-8534
dc.contributor.orcidimecHoussa, Michel::0000-0003-1844-3515
dc.contributor.orcidimecMeuris, Marc::0000-0002-9580-6810
dc.date.accessioned2021-10-18T02:38:46Z
dc.date.available2021-10-18T02:38:46Z
dc.date.embargo9999-12-31
dc.date.issued2009
dc.identifier.issn0167-9317
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/16163
dc.source.beginpage1747
dc.source.endpage1750
dc.source.issue7_9
dc.source.journalMicroelectronic Engineering
dc.source.volume86
dc.title

A first-principles study of the structural and electronic properties of III-V/thermal oxide interfaces

dc.typeJournal article
dspace.entity.typePublication
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