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EUV secondary electron blur at the 22nm half pitch node
Publication:
EUV secondary electron blur at the 22nm half pitch node
Date
2011
Proceedings Paper
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21317.pdf
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Gronheid, Roel
;
Younkin, Todd
;
Leeson, Michael
;
Fonseca, Carlos
;
Hooge, Joshua
;
Nafus, Kathleen
;
Biafore, John
;
Smith, Mark D.
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1943
since deposited on 2021-10-19
Acq. date: 2025-10-24
Citations
Metrics
Views
1943
since deposited on 2021-10-19
Acq. date: 2025-10-24
Citations