Publication:
Carbon nanotubes grown in contact holes for nano electronic applications: how to prepare TEM samples by FIB?
Date
| dc.contributor.author | Ke, Xiaoxing | |
| dc.contributor.author | Bals, Sara | |
| dc.contributor.author | Romo Negreira, Ainhoa | |
| dc.contributor.author | Hantschel, Thomas | |
| dc.contributor.author | Bender, Hugo | |
| dc.contributor.author | Van Tendeloo, Gustaaf | |
| dc.contributor.imecauthor | Romo Negreira, Ainhoa | |
| dc.contributor.imecauthor | Hantschel, Thomas | |
| dc.contributor.imecauthor | Bender, Hugo | |
| dc.contributor.orcidimec | Hantschel, Thomas::0000-0001-9476-4084 | |
| dc.date.accessioned | 2021-10-17T07:57:48Z | |
| dc.date.available | 2021-10-17T07:57:48Z | |
| dc.date.issued | 2008-09 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/13943 | |
| dc.source.beginpage | 673 | |
| dc.source.conference | 14th European Microscopy Congress | |
| dc.source.conferencedate | 1/09/2008 | |
| dc.source.conferencelocation | Aachen Germany | |
| dc.source.endpage | 674 | |
| dc.title | Carbon nanotubes grown in contact holes for nano electronic applications: how to prepare TEM samples by FIB? | |
| dc.type | Proceedings paper | |
| dspace.entity.type | Publication | |
| Files | ||
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