Publication:

Radiation damage studies of strain-engineered and high-mobility deep submicrometer MOSFETs

Date

Loading...
Thumbnail Image

Abstract

Description

Metrics

Views

1960 since deposited on 2021-10-17
1last month
Acq. date: 2025-12-08

Citations

Metrics

Views

1960 since deposited on 2021-10-17
1last month
Acq. date: 2025-12-08

Citations