Publication:
Scaling the SOT track A path towards maximizing efficiency in SOT-MRAM
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| dc.contributor.author | Van Beek, Simon | |
| dc.contributor.author | Cai, Kaiming | |
| dc.contributor.author | Yasin, Farrukh | |
| dc.contributor.author | Hody, Hubert | |
| dc.contributor.author | Talmelli, Giacomo | |
| dc.contributor.author | Nguyen, Van Dai | |
| dc.contributor.author | Franchina Vergel, Nathali | |
| dc.contributor.author | Palomino, A. | |
| dc.contributor.author | Trovato, Anna | |
| dc.contributor.author | Wostyn, Kurt | |
| dc.contributor.author | Rao, Siddharth | |
| dc.contributor.author | Kar, Gouri Sankar | |
| dc.contributor.author | Couet, Sebastien | |
| dc.date.accessioned | 2026-05-04T07:53:45Z | |
| dc.date.available | 2026-05-04T07:53:45Z | |
| dc.date.createdwos | 2026-03-24 | |
| dc.date.issued | 2023 | |
| dc.description.abstract | We demonstrate, for the first time, the functionality of a scaled perpendicular spin-orbit torque (SOT)-MRAM where the SOT layer and magnetic tunnel junction (MTJ) pillar exhibit comparable dimensions. This novel design leads to a significant reduction in the power consumption (63% decrease), an enhancement in endurance (>1015 cycles), and a reduction in bit-cell area. Systematic investigations on device scaling are performed, highlighting the importance of SOT track scaling as a path to enhance the device performance by eliminating power consumption outside the MTJ pillar region. Furthermore, the hybrid free layer stack design offers a potential solution for scaling MTJ dimensions, as it enables low switching current and sufficient retention down to 20 nm. | |
| dc.description.wosFundingText | This work is supported by imee's industrial affiliation program on MRAM devices. We also acknowledge support from the ECSEL Joint Undertaking Program (grant No. 876925-project ANDANTE). | |
| dc.identifier.doi | 10.1109/iedm45741.2023.10413749 | |
| dc.identifier.issn | 2380-9248 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/59270 | |
| dc.language.iso | eng | |
| dc.provenance.editstepuser | greet.vanhoof@imec.be | |
| dc.publisher | IEEE | |
| dc.source.conference | International Electron Devices Meeting (IEDM) | |
| dc.source.conferencedate | 2023-12-09 | |
| dc.source.conferencelocation | San Francisco | |
| dc.source.journal | 2023 INTERNATIONAL ELECTRON DEVICES MEETING, IEDM | |
| dc.source.numberofpages | 4 | |
| dc.title | Scaling the SOT track A path towards maximizing efficiency in SOT-MRAM | |
| dc.type | Proceedings paper | |
| dspace.entity.type | Publication | |
| imec.internal.crawledAt | 2026-04-07 | |
| imec.internal.source | crawler | |
| imec.internal.wosCreatedAt | 2026-04-07 | |
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