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Scaling the SOT track A path towards maximizing efficiency in SOT-MRAM

 
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dc.contributor.authorVan Beek, Simon
dc.contributor.authorCai, Kaiming
dc.contributor.authorYasin, Farrukh
dc.contributor.authorHody, Hubert
dc.contributor.authorTalmelli, Giacomo
dc.contributor.authorNguyen, Van Dai
dc.contributor.authorFranchina Vergel, Nathali
dc.contributor.authorPalomino, A.
dc.contributor.authorTrovato, Anna
dc.contributor.authorWostyn, Kurt
dc.contributor.authorRao, Siddharth
dc.contributor.authorKar, Gouri Sankar
dc.contributor.authorCouet, Sebastien
dc.date.accessioned2026-05-04T07:53:45Z
dc.date.available2026-05-04T07:53:45Z
dc.date.createdwos2026-03-24
dc.date.issued2023
dc.description.abstractWe demonstrate, for the first time, the functionality of a scaled perpendicular spin-orbit torque (SOT)-MRAM where the SOT layer and magnetic tunnel junction (MTJ) pillar exhibit comparable dimensions. This novel design leads to a significant reduction in the power consumption (63% decrease), an enhancement in endurance (>1015 cycles), and a reduction in bit-cell area. Systematic investigations on device scaling are performed, highlighting the importance of SOT track scaling as a path to enhance the device performance by eliminating power consumption outside the MTJ pillar region. Furthermore, the hybrid free layer stack design offers a potential solution for scaling MTJ dimensions, as it enables low switching current and sufficient retention down to 20 nm.
dc.description.wosFundingTextThis work is supported by imee's industrial affiliation program on MRAM devices. We also acknowledge support from the ECSEL Joint Undertaking Program (grant No. 876925-project ANDANTE).
dc.identifier.doi10.1109/iedm45741.2023.10413749
dc.identifier.issn2380-9248
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/59270
dc.language.isoeng
dc.provenance.editstepusergreet.vanhoof@imec.be
dc.publisherIEEE
dc.source.conferenceInternational Electron Devices Meeting (IEDM)
dc.source.conferencedate2023-12-09
dc.source.conferencelocationSan Francisco
dc.source.journal2023 INTERNATIONAL ELECTRON DEVICES MEETING, IEDM
dc.source.numberofpages4
dc.title

Scaling the SOT track A path towards maximizing efficiency in SOT-MRAM

dc.typeProceedings paper
dspace.entity.typePublication
imec.internal.crawledAt2026-04-07
imec.internal.sourcecrawler
imec.internal.wosCreatedAt2026-04-07
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