Publication:
Speed - accuracy trade-off for measurement and characterization of the matching performance of SiGe:C HBTs, applied to a 200 GHz technology
Date
| dc.contributor.author | Choi, Li Jen | |
| dc.contributor.author | Venegas, Rafael | |
| dc.contributor.author | Decoutere, Stefaan | |
| dc.contributor.imecauthor | Decoutere, Stefaan | |
| dc.contributor.orcidimec | Decoutere, Stefaan::0000-0001-6632-6239 | |
| dc.date.accessioned | 2021-10-16T00:57:05Z | |
| dc.date.available | 2021-10-16T00:57:05Z | |
| dc.date.issued | 2005-04 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/10219 | |
| dc.source.beginpage | 143 | |
| dc.source.conference | IEEE International Conference on Microelectronic Test Structures | |
| dc.source.conferencedate | 4/04/2005 | |
| dc.source.conferencelocation | Leuven Belgium | |
| dc.source.endpage | 148 | |
| dc.title | Speed - accuracy trade-off for measurement and characterization of the matching performance of SiGe:C HBTs, applied to a 200 GHz technology | |
| dc.type | Proceedings paper | |
| dspace.entity.type | Publication | |
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