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Impact of dummy gate removal and a silicon cap on the noise performance of germanium nFinFETs
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Impact of dummy gate removal and a silicon cap on the noise performance of germanium nFinFETs
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Date
2020
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Xie, Duan
;
Simoen, Eddy
;
Chen, Haifeng
;
Arimura, Hiroaki
;
Horiguchi, Naoto
Journal
IEEE Transactions on Electron Devices
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1943
since deposited on 2021-10-29
Acq. date: 2025-12-16
Citations
Metrics
Views
1943
since deposited on 2021-10-29
Acq. date: 2025-12-16
Citations