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Electron irradiation induced defects in germanium-doped Czochralski silicon substrates and diodes

Date

2011
Journal article
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dc.contributor.authorChen, Jiahe
dc.contributor.authorVanhellemont, Jan
dc.contributor.authorSimoen, Eddy
dc.contributor.authorLauwaert, Johan
dc.contributor.authorVrielinck, Henk
dc.contributor.authorRafi, Joan Marc
dc.contributor.authorOhyama, Hidenori
dc.contributor.authorWeber, Jorg
dc.contributor.authorYang, Deren
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.date.accessioned2021-10-19T12:44:42Z
dc.date.available2021-10-19T12:44:42Z
dc.date.embargo9999-12-31
dc.date.issued2011
dc.identifier.issn1610-1634
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/18660
dc.source.beginpage674
dc.source.endpage677
dc.source.issue3
dc.source.journalPhysica Status Solidi C
dc.source.volume8
dc.title

Electron irradiation induced defects in germanium-doped Czochralski silicon substrates and diodes

dc.typeJournal article
dspace.entity.typePublication
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