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Conference contributions
Failure mechanisms and reliability issues of RF-MEMS switches
Publication:
Failure mechanisms and reliability issues of RF-MEMS switches
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Date
2005
Proceedings Paper
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19169.pdf
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
De Wolf, Ingrid
;
Czarnecki, Piotr
;
Jourdain, Anne
;
Kalicinski, Stanislaw
;
Modlinski, Robert
;
Muller, Philippe
;
Rottenberg, Xavier
;
Soussan, Philippe
;
Tilmans, Harrie
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1933
since deposited on 2021-10-16
Acq. date: 2025-12-15
Citations
Metrics
Views
1933
since deposited on 2021-10-16
Acq. date: 2025-12-15
Citations