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Conference contributions
Impact of interface layer on charge trapping in Si:HfO2 based FeF FT
Publication:
Impact of interface layer on charge trapping in Si:HfO2 based FeF FT
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Date
2020
Proceedings Paper
https://doi.org/10.1109/IIRW49815.2020.9312866
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Jung, Taehwan
;
O'Sullivan, Barry
;
Ronchi, Nicolo
;
Linten, Dimitri
;
Shin, Changhwan
;
Van Houdt, Jan
Journal
na
Abstract
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1853
since deposited on 2021-11-02
Acq. date: 2025-12-15
Citations
Metrics
Views
1853
since deposited on 2021-11-02
Acq. date: 2025-12-15
Citations