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Reference survey spectra of elemental solid measured with Cr K-alpha photons as a tool for Quases analysis (4): Group III and IV elements (B, Al, In, C, Si, Ge, Sn, Pb)

Date

2022
Journal article
https://doi.org/10.1116/6.0001955
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dc.contributor.authorZborowski, Charlotte
dc.contributor.authorConard, Thierry
dc.contributor.authorVanleenhove, Anja
dc.contributor.authorHoflijk, Ilse
dc.contributor.authorVaesen, Inge
dc.contributor.imecauthorZborowski, Charlotte
dc.contributor.imecauthorConard, Thierry
dc.contributor.imecauthorVanleenhove, Anja
dc.contributor.imecauthorHoflijk, Ilse
dc.contributor.imecauthorVaesen, Inge
dc.contributor.orcidimecConard, Thierry::0000-0002-4298-5851
dc.contributor.orcidimecVaesen, Inge::0000-0003-3533-4679
dc.date.accessioned2022-11-15T10:44:03Z
dc.date.available2022-09-24T02:50:56Z
dc.date.available2022-11-15T10:44:03Z
dc.date.embargo2023-09-16
dc.date.issued2022
dc.identifier.doi10.1116/6.0001955
dc.identifier.issn1055-5269
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/40502
dc.publisherAIP Publishing
dc.source.beginpage024005
dc.source.endpagena
dc.source.issue2
dc.source.journalSURFACE SCIENCE SPECTRA
dc.source.numberofpages13
dc.source.volume29
dc.subject.keywordsINELASTIC BACKGROUND ANALYSIS
dc.subject.keywordsHAXPES
dc.subject.keywordsXPS
dc.subject.keywordsQUANTIFICATION
dc.title

Reference survey spectra of elemental solid measured with Cr K-alpha photons as a tool for Quases analysis (4): Group III and IV elements (B, Al, In, C, Si, Ge, Sn, Pb)

dc.typeJournal article
dspace.entity.typePublication
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