Publication:

Exploring the Benefits of Cryogenic Temperatures for Co and Ru Metallizations

 
dc.contributor.authorTierno, Davide
dc.contributor.authorCiofi, Ivan
dc.contributor.authorParvais, Bertrand
dc.contributor.authorCroes, Kristof
dc.contributor.authorVarela Pedreira, Olalla
dc.contributor.imecauthorTierno, Davide
dc.contributor.imecauthorCiofi, Ivan
dc.contributor.imecauthorParvais, Bertrand
dc.contributor.imecauthorCroes, Kristof
dc.contributor.imecauthorVarela Pedreira, Olalla
dc.contributor.orcidimecTierno, Davide::0000-0003-4915-904X
dc.contributor.orcidimecCiofi, Ivan::0000-0003-1374-4116
dc.contributor.orcidimecParvais, Bertrand::0000-0003-0769-7069
dc.contributor.orcidimecCroes, Kristof::0000-0002-3955-0638
dc.contributor.orcidimecVarela Pedreira, Olalla::0000-0002-2987-1972
dc.date.accessioned2023-08-09T12:36:58Z
dc.date.available2023-08-07T17:07:26Z
dc.date.available2023-08-08T13:28:38Z
dc.date.available2023-08-09T12:36:58Z
dc.date.embargo9999-12-31
dc.date.issued2023
dc.identifier.doi10.1109/IITC/MAM57687.2023.10154717
dc.identifier.eisbn979-8-3503-1097-9
dc.identifier.issn2380-632X
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/42295
dc.publisherIEEE
dc.source.conferenceIEEE International Interconnect Technology Conference (IITC) / IEEE Materials for Advanced Metallization Conference (MAM)
dc.source.conferencedateMAY 22-25, 2023
dc.source.conferencelocationDresden
dc.source.journalIEEE International Conference on Interconnect Technology
dc.source.numberofpages3
dc.subject.keywordsRESISTANCE
dc.subject.keywordsRESISTIVITY
dc.title

Exploring the Benefits of Cryogenic Temperatures for Co and Ru Metallizations

dc.typeProceedings paper
dspace.entity.typePublication
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