Skip to content
Institutional repository
Communities & Collections
Browse all items
Scientific publications
Open knowledge
Log In
imec Publications
Presentations
Two-dimensional carrier profiling using scanning probes
Publication:
Two-dimensional carrier profiling using scanning probes
Copy permalink
Date
2002
Presentation
Simple item page
Full metadata
Statistics
Loading...
Loading...
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Vandervorst, Wilfried
;
Eyben, Pierre
;
Duhayon, Natasja
;
Fouchier, Marc
;
Xu, Mingwei
Journal
Abstract
Description
Metrics
Views
1932
since deposited on 2021-10-14
2
last month
Acq. date: 2025-12-15
Citations
Metrics
Views
1932
since deposited on 2021-10-14
2
last month
Acq. date: 2025-12-15
Citations