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A methodology for double patterning compliant split and design
Publication:
A methodology for double patterning compliant split and design
Date
2008
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Wiaux, Vincent
;
Verhaegen, Staf
;
Iwamoto, Fumio
;
Maenhoudt, Mireille
;
Matsuda, Takashi
;
Postnikov, Sergey
;
Vandenberghe, Geert
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1923
since deposited on 2021-10-17
Acq. date: 2025-10-22
Citations
Metrics
Views
1923
since deposited on 2021-10-17
Acq. date: 2025-10-22
Citations