Publication:

Reliability characterization of gate-stacks for III-V channel MOSFETs

Date

2019-02
Dissertation
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dc.contributor.authorPutcha, Vamsi
dc.contributor.imecauthorPutcha, Vamsi
dc.contributor.orcidimecPutcha, Vamsi::0000-0003-1907-5486
dc.contributor.thesisadvisorGroeseneken, Guido
dc.date.accessioned2021-10-27T16:28:45Z
dc.date.available2021-10-27T16:28:45Z
dc.date.embargo9999-12-31
dc.date.issued2019-02
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/33836
dc.identifier.urlhttps://limo.libis.be/primo-explore/fulldisplay?docid=LIRIAS2363730&context=L&vid=Lirias&search_scope=Lirias&tab=default_tab&lang=en_US&fromSitemap=1
dc.title

Reliability characterization of gate-stacks for III-V channel MOSFETs

dc.typePHD thesis
dspace.entity.typePublication
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