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Trap-assisted tunneling in deep-submicron Ge PFET junctions
Publication:
Trap-assisted tunneling in deep-submicron Ge PFET junctions
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Date
2010
Proceedings Paper
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Eneman, Geert
;
Bargallo Gonzalez, Mireia
;
Hellings, Geert
;
De Jaeger, Brice
;
Wang, Gang
;
Mitard, Jerome
;
De Meyer, Kristin
;
Claeys, Cor
;
Meuris, Marc
;
Heyns, Marc
;
Hoffmann, Thomas Y.
;
Simoen, Eddy
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1890
since deposited on 2021-10-18
Acq. date: 2025-12-15
Citations
Metrics
Views
1890
since deposited on 2021-10-18
Acq. date: 2025-12-15
Citations