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Correlated X-Ray and Electron Microscopies of a Single Biphasic GaAs Nanowire

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dc.contributor.authorDursap, Thomas
dc.contributor.authorZhou, Tao
dc.contributor.authorDupraz, Maxime
dc.contributor.authorLabat, Stephane
dc.contributor.authorThomas, Olivier
dc.contributor.authorFardeau, Niels
dc.contributor.authorRegreny, Philippe
dc.contributor.authorGendry, Michel
dc.contributor.authorBrottet, Solene
dc.contributor.authorBlanchard, Nicholas P.
dc.contributor.authorHolt, Martin V.
dc.contributor.authorRichard, Marie-Ingrid
dc.contributor.authorDanescu, Alexandru
dc.contributor.authorPenuelas, Jose
dc.contributor.authorBugnet, Matthieu
dc.contributor.imecauthorDursap, Thomas
dc.contributor.orcidimecDursap, Thomas::0009-0004-8907-4969
dc.date.accessioned2025-08-18T03:58:57Z
dc.date.available2025-08-18T03:58:57Z
dc.date.issued2025-AUG 7
dc.description.wosFundingTextT.D. and T.Z. contributed equally to this work. The authors acknowledge access to the NanoLyon platform for the synthesis of NW by MBE. The (S)TEM and FIB work was performed at the consortium Lyon-St-Etienne de microscopie. The authors are grateful to APS synchrotron for allocating beamtime (GUP66380). Work performed at the Center for Nanoscale Materials and Advanced Photon Source (APS), both U.S. Department of Energy Office of Science User Facilities, was supported by the U.S. DOE, Office of Basic Energy Sciences, under Contract No. DE-AC02-06CH11357. T.D., A.D., J.P., and M.B. acknowledge financial support by the French Agence Nationale de la Recherche (ANR) for funding (project BEEP ANR-18-CE05-0017-01). MD and MIR are grateful for funding from the European Research Council (ERC) under the European Union's Horizon 2020 research and innovation programme (grant agreement No. 818823).
dc.identifier.doi10.1002/smtd.202500740
dc.identifier.issn2366-9608
dc.identifier.pmidMEDLINE:40772372
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/46093
dc.publisherWILEY-V C H VERLAG GMBH
dc.source.journalSMALL METHODS
dc.source.numberofpages10
dc.subject.keywordsSTRAIN
dc.subject.keywordsSURFACE
dc.subject.keywordsSEMICONDUCTORS
dc.subject.keywordsZINCBLENDE
dc.subject.keywordsDYNAMICS
dc.subject.keywordsWURTZITE
dc.subject.keywordsGROWTH
dc.title

Correlated X-Ray and Electron Microscopies of a Single Biphasic GaAs Nanowire

dc.typeJournal article
dspace.entity.typePublication
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