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Potential sources of inaccuracy for the composition quantification of InGaAs and InAlAs

Date

2017
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dc.contributor.authorCuduvally, Ramya
dc.contributor.authorMorris, Richard
dc.contributor.authorMelkonyan, Davit
dc.contributor.authorArnoldi, Laurent
dc.contributor.authorBogdanowicz, Janusz
dc.contributor.authorFleischmann, Claudia
dc.contributor.authorVandervorst, Wilfried
dc.contributor.imecauthorCuduvally, Ramya
dc.contributor.imecauthorMorris, Richard
dc.contributor.imecauthorBogdanowicz, Janusz
dc.contributor.imecauthorFleischmann, Claudia
dc.contributor.imecauthorVandervorst, Wilfried
dc.contributor.orcidimecMorris, Richard::0000-0002-0902-7088
dc.contributor.orcidimecBogdanowicz, Janusz::0000-0002-7503-8922
dc.contributor.orcidimecFleischmann, Claudia::0000-0003-1531-6916
dc.date.accessioned2021-10-24T03:38:55Z
dc.date.available2021-10-24T03:38:55Z
dc.date.issued2017
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/28081
dc.source.conference7th European Atom Probe Workshop
dc.source.conferencedate2/10/2017
dc.source.conferencelocationGullmarsstrand Sweden
dc.title

Potential sources of inaccuracy for the composition quantification of InGaAs and InAlAs

dc.typeOral presentation
dspace.entity.typePublication
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