Publication:

MOSFET variability and reliability characterization array

Date

2015
Meeting abstract
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dc.contributor.authorSimicic, Marko
dc.contributor.authorPutcha, Vamsi
dc.contributor.authorParvais, Bertrand
dc.contributor.authorWeckx, Pieter
dc.contributor.authorKaczer, Ben
dc.contributor.authorGroeseneken, Guido
dc.contributor.authorGielen, Georges
dc.contributor.authorLinten, Dimitri
dc.contributor.authorThean, Aaron
dc.contributor.imecauthorSimicic, Marko
dc.contributor.imecauthorPutcha, Vamsi
dc.contributor.imecauthorParvais, Bertrand
dc.contributor.imecauthorWeckx, Pieter
dc.contributor.imecauthorKaczer, Ben
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.imecauthorGielen, Georges
dc.contributor.imecauthorLinten, Dimitri
dc.contributor.imecauthorThean, Aaron
dc.contributor.orcidimecSimicic, Marko::0000-0002-3623-1842
dc.contributor.orcidimecPutcha, Vamsi::0000-0003-1907-5486
dc.contributor.orcidimecParvais, Bertrand::0000-0003-0769-7069
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.contributor.orcidimecGroeseneken, Guido::0000-0003-3763-2098
dc.contributor.orcidimecLinten, Dimitri::0000-0001-8434-1838
dc.date.accessioned2021-10-22T22:52:21Z
dc.date.available2021-10-22T22:52:21Z
dc.date.issued2015
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/25906
dc.identifier.urlhttp://www.iirw.org/fileadmin/user_upload/2015_9_18_IIRW_2015_TPC_Schedule.pdf
dc.source.conferenceIEEE International Integrated Reliability Workshop - IIRW
dc.source.conferencedate11/10/2015
dc.source.conferencelocationSouth Lake tahoe, CA USA
dc.title

MOSFET variability and reliability characterization array

dc.typeMeeting abstract
dspace.entity.typePublication
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