Publication:

Low-frequency noise characteristics of waveguide-integrated lateral and vertical Ge-on-Si p-i-n photodiodes

Date

2025
Journal article
https://doi.org/10.1063/5.0287589
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dc.contributor.authorMusibau, Solomon
dc.contributor.authorArnold, Kellen P.
dc.contributor.authorVeluri, Anurag R.
dc.contributor.authorFranco, Jacopo
dc.contributor.authorTsiara, Artemisia
dc.contributor.authorCroes, Kristof
dc.contributor.authorVan Campenhout, Joris
dc.contributor.authorSchrimpf, Ronald D.
dc.contributor.authorReed, Robert A.
dc.contributor.authorDe Wolf, Ingrid
dc.contributor.authorFleetwood, Daniel M.
dc.date.accessioned2025-12-19T09:55:37Z
dc.date.available2025-12-19T09:55:37Z
dc.date.createdwos2025-10-29
dc.date.issued2025
dc.description.wosFundingTextThe imec industrial affiliation R&D program on Optical I/O is acknowledged for technical support. Sharon M. Weiss, Tianfang K. Liu, Phoenix Harris, and Xuyi Luo are acknowledged for experimental and technical support. Emmanuel Chery, Steven L. Kosier, and Enxia Zhang are thanked for insightful technical discussions. This work was supported by a grant for a long stay abroad from the Research Foundation-Flanders (FWO, Belgium) (Application No. #V439524N) and by the National Science Foundation (NSF, USA) Industry-University Cooperative Research (IUCRC) Electronic-Photonic Integrated Circuits for Aerospace (EPICA) (Award No. 2052742). Kellen P. Arnold's effort on this work was supported by the National Aeronautics and Space Administration (NASA) Space Technology Graduate Research Opportunities (NSTGRO) 2023 Fellowship under Award No. 80NSSC23K1198.
dc.identifier.doi10.1063/5.0287589
dc.identifier.issn0021-8979
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/58609
dc.language.isoeng
dc.provenance.editstepusergreet.vanhoof@imec.be
dc.publisherAIP Publishing
dc.source.beginpage155706
dc.source.issue15
dc.source.journalJOURNAL OF APPLIED PHYSICS
dc.source.numberofpages14
dc.source.volume138
dc.subject.keywords1/F NOISE
dc.subject.keywordsSILICON PHOTONICS
dc.subject.keywordsGENERATION
dc.subject.keywordsRECOMBINATION
dc.subject.keywordsRELIABILITY
dc.subject.keywordsDEFECTS
dc.subject.keywordsRADIATION
dc.subject.keywordsCARRIERS
dc.subject.keywordsDIODES
dc.subject.keywordsTOOL
dc.title

Low-frequency noise characteristics of waveguide-integrated lateral and vertical Ge-on-Si p-i-n photodiodes

dc.typeJournal article
dspace.entity.typePublication
imec.internal.crawledAt2025-10-22
imec.internal.crawledAt2025-10-22
imec.internal.sourcecrawler
imec.internal.sourcecrawler
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