Skip to content
Institutional repository
Communities & Collections
Browse all items
Scientific publications
Open knowledge
Log In
imec Publications
Conference contributions
A deep level transient spectroscopy comparison of the SiO2/Si and Al2O3/Si interface states
Publication:
A deep level transient spectroscopy comparison of the SiO2/Si and Al2O3/Si interface states
Copy permalink
Date
2011
Proceedings Paper
Simple item page
Full metadata
Statistics
Loading...
Loading...
Files
23729.pdf
219.79 KB
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Simoen, Eddy
;
Rothschild, Aude
;
Vermang, Bart
;
Poortmans, Jef
;
Mertens, Robert
Journal
Abstract
Description
Metrics
Views
1963
since deposited on 2021-10-19
1
last month
Acq. date: 2026-01-09
Citations
Metrics
Views
1963
since deposited on 2021-10-19
1
last month
Acq. date: 2026-01-09
Citations