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A deep level transient spectroscopy comparison of the SiO2/Si and Al2O3/Si interface states
Publication:
A deep level transient spectroscopy comparison of the SiO2/Si and Al2O3/Si interface states
Date
2011
Proceedings Paper
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23729.pdf
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Simoen, Eddy
;
Rothschild, Aude
;
Vermang, Bart
;
Poortmans, Jef
;
Mertens, Robert
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1959
since deposited on 2021-10-19
Acq. date: 2025-10-23
Citations
Metrics
Views
1959
since deposited on 2021-10-19
Acq. date: 2025-10-23
Citations