Publication:
200mm Reconstituted Wafer for Fan-out of Microfluidics and CMOS Electronics
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| cris.virtualsource.orcid | 1f8901d6-63e4-4b60-bcdc-a085244909c7 | |
| dc.contributor.author | Wei, Wei | |
| dc.contributor.author | Zhang, Lei | |
| dc.contributor.author | Tobback, Bert | |
| dc.contributor.author | Visker, Jakob | |
| dc.contributor.author | Malainou, Antonia | |
| dc.contributor.author | Stakenborg, Tim | |
| dc.contributor.author | Karve, Gauri | |
| dc.contributor.author | Sabuncuoglu Tezcan, Deniz | |
| dc.date.accessioned | 2026-05-28T07:17:02Z | |
| dc.date.available | 2026-05-28T07:17:02Z | |
| dc.date.createdwos | 2026-02-10 | |
| dc.date.issued | 2024 | |
| dc.description.abstract | Wafer reconstruction uses an embedded die method by putting separated chips from different sources on a shared silicon carrier [1]–[4]. This platform enables further processing on landing wafer as a regular 200mm substrate, which provides solution to fan-out both electronics and microfluidics. This paper describes the complete process on reconstructed wafer where we accomplish the combination of active chips and microfluidics structures. This work demonstrates the potential of wafer reconstruction as an integration process platform for life science applications. | |
| dc.description.wosFundingText | This work is part of the Moore4Medical project funded by the ECSEL Joint Undertaking under the grant number H2020-EXCEL-2019-IA-876190. Authors also thank for imec engineers Geert Langenus, Geert Schoofs for population process, Glen Maes and Hans Dusar for non-standard SiO2 thickness measurement, Riet Labie for Glass bonding test. | |
| dc.identifier.doi | 10.1109/eptc62800.2024.10909847 | |
| dc.identifier.isbn | 979-8-3315-2201-8 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/59449 | |
| dc.language.iso | eng | |
| dc.provenance.editstepuser | greet.vanhoof@imec.be | |
| dc.publisher | IEEE | |
| dc.source.beginpage | 458 | |
| dc.source.conference | IEEE 26th Electronics Packaging Technology Conference (EPTC) | |
| dc.source.conferencedate | 2024-12-03 | |
| dc.source.conferencelocation | Singapore | |
| dc.source.endpage | 461 | |
| dc.source.journal | 2024 IEEE 26TH ELECTRONICS PACKAGING TECHNOLOGY CONFERENCE, EPTC | |
| dc.source.numberofpages | 4 | |
| dc.title | 200mm Reconstituted Wafer for Fan-out of Microfluidics and CMOS Electronics | |
| dc.type | Proceedings paper | |
| dspace.entity.type | Publication | |
| imec.internal.crawledAt | 2026-04-07 | |
| imec.internal.source | crawler | |
| imec.internal.wosCreatedAt | 2026-04-07 | |
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