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Publication:
Integrated scatterometry for contact hole monitoring
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Date
2004
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Cheng, Shaunee
;
Storms, Greet
;
Baudemprez, Bart
;
Barry, K.
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Abstract
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1884
since deposited on 2021-10-15
Acq. date: 2026-06-27
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Views
1884
since deposited on 2021-10-15
Acq. date: 2026-06-27
Citations
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