Publication:

Characterization of Al/Ti and NiGe ohmic contacts to n-type GeSn CVD-grown layers

Date

2012
Meeting abstract
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dc.contributor.authorFirrincieli, Andrea
dc.contributor.authorGupta, Suyog
dc.contributor.authorVincent, Benjamin
dc.contributor.authorGencarelli, Federica
dc.contributor.authorLin, Dennis
dc.contributor.authorSimoen, Eddy
dc.contributor.authorVandervorst, Wilfried
dc.contributor.authorClaeys, Cor
dc.contributor.authorSaraswat, K.
dc.contributor.authorKittl, Jorge
dc.contributor.imecauthorFirrincieli, Andrea
dc.contributor.imecauthorVincent, Benjamin
dc.contributor.imecauthorLin, Dennis
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.imecauthorVandervorst, Wilfried
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.date.accessioned2021-10-20T11:01:00Z
dc.date.available2021-10-20T11:01:00Z
dc.date.embargo9999-12-31
dc.date.issued2012
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/20680
dc.source.beginpageP4-05
dc.source.conferenceMaterials for Advanced Metallization - MAM
dc.source.conferencedate11/03/2012
dc.source.conferencelocationGrenoble France
dc.title

Characterization of Al/Ti and NiGe ohmic contacts to n-type GeSn CVD-grown layers

dc.typeMeeting abstract
dspace.entity.typePublication
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