Publication:
Impact of Externally Induced Local Mechanical Stress on Electrical Performance of Decananometer MOSFETs
| dc.contributor.author | Lee, Kookjin | |
| dc.contributor.author | Kaczer, Ben | |
| dc.contributor.author | Kruv, Anastasiia | |
| dc.contributor.author | Gonzalez, Mario | |
| dc.contributor.author | Eneman, Geert | |
| dc.contributor.author | Okudur, Oguzhan Orkut | |
| dc.contributor.author | Grill, Alexander | |
| dc.contributor.author | De Wolf, Ingrid | |
| dc.contributor.imecauthor | Lee, Kookjin | |
| dc.contributor.imecauthor | Kaczer, Ben | |
| dc.contributor.imecauthor | Kruv, Anastasiia | |
| dc.contributor.imecauthor | Gonzalez, Mario | |
| dc.contributor.imecauthor | Eneman, Geert | |
| dc.contributor.imecauthor | Okudur, Oguzhan Orkut | |
| dc.contributor.imecauthor | Grill, Alexander | |
| dc.contributor.imecauthor | De Wolf, Ingrid | |
| dc.contributor.orcidimec | Lee, Kookjin::0000-0002-9896-1090 | |
| dc.contributor.orcidimec | Kaczer, Ben::0000-0002-1484-4007 | |
| dc.contributor.orcidimec | Gonzalez, Mario::0000-0003-4374-4854 | |
| dc.contributor.orcidimec | Eneman, Geert::0000-0002-5849-3384 | |
| dc.contributor.orcidimec | Okudur, Oguzhan Orkut::0000-0002-4790-7772 | |
| dc.contributor.orcidimec | Grill, Alexander::0000-0003-1615-1033 | |
| dc.contributor.orcidimec | De Wolf, Ingrid::0000-0003-3822-5953 | |
| dc.date.accessioned | 2023-05-16T12:48:58Z | |
| dc.date.available | 2022-08-08T02:36:09Z | |
| dc.date.available | 2023-05-16T12:48:58Z | |
| dc.date.issued | 2022 | |
| dc.description.wosFundingText | This work was supported by the European Commission under the 7th Framework Program (Collaborative Project MORDRED) under Contract 261868. | |
| dc.identifier.doi | 10.1109/TED.2022.3193023 | |
| dc.identifier.issn | 0018-9383 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/40232 | |
| dc.publisher | IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC | |
| dc.source.beginpage | 5382 | |
| dc.source.endpage | 5385 | |
| dc.source.issue | 9 | |
| dc.source.journal | IEEE TRANSACTIONS ON ELECTRON DEVICES | |
| dc.source.numberofpages | 4 | |
| dc.source.volume | 69 | |
| dc.subject.keywords | BALLISTIC TRANSPORT | |
| dc.subject.keywords | MOBILITY | |
| dc.title | Impact of Externally Induced Local Mechanical Stress on Electrical Performance of Decananometer MOSFETs | |
| dc.type | Journal article | |
| dspace.entity.type | Publication | |
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