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New shift-&-ratio Leff extraction algorithm for fully-depleted SOI CMOS transistors

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dc.contributor.authorvan Meer, Hans
dc.contributor.authorDe Meyer, Kristin
dc.contributor.imecauthorDe Meyer, Kristin
dc.date.accessioned2021-10-14T14:02:00Z
dc.date.available2021-10-14T14:02:00Z
dc.date.embargo9999-12-31
dc.date.issued2000
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/4840
dc.source.beginpage348
dc.source.conferenceProceedings of the 30th European Solid-State Device Research Conference - ESSDERC
dc.source.conferencedate11/09/2000
dc.source.conferencelocationCork Ireland
dc.source.endpage351
dc.title

New shift-&-ratio Leff extraction algorithm for fully-depleted SOI CMOS transistors

dc.typeProceedings paper
dspace.entity.typePublication
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