Improving MOCVD MoS2 electrical performance: reducing ambient exposure

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36120.pdf 1.51 MB

Author(s)

Leonhardt, Alessandra

;

Chiappe, Daniele

;

Asselberghs, Inge

;

Huyghebaert, Cedric

;

;

De Gendt, Stefan

Journal

IEEE Electron Device Letters

Metrics

1881 since deposited on 2021-10-24

Acq. date: 2025-10-23