Publication:

Forward gate bias on-state stress on AlGaN/GaN MIS-HEMTs for power switching applications

Date

Loading...
Thumbnail Image

Abstract

Description

Statistics

Views

1924 since deposited on 2021-10-20
5last month
3last week
Acq. date: 2026-08-08

Citations

Statistics

Views

1924 since deposited on 2021-10-20
5last month
3last week
Acq. date: 2026-08-08

Citations