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Articles
Enhancing the defect contrast in ECCI through angular filtering of BSEs
Publication:
Enhancing the defect contrast in ECCI through angular filtering of BSEs
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Date
2020
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Han, Han
;
Hantschel, Thomas
;
Schulze, Andreas
;
Strakos, Libor
;
Vystavel, Tomas
;
Loo, Roger
;
Kunert, Bernardette
;
Langer, Robert
;
Vandervorst, Wilfried
;
Caymax, Matty
Journal
Ultramicroscopy
Abstract
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1993
since deposited on 2021-10-28
Acq. date: 2025-12-10
Citations
Metrics
Views
1993
since deposited on 2021-10-28
Acq. date: 2025-12-10
Citations