Publication:
High-k metal gate MOSFETs: Impact of extrinsic process condition on the gate-stack quality. A mobility study
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1896 since deposited on 2021-10-16
3last month
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Acq. date: 2026-04-05
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Statistics
Views
1896 since deposited on 2021-10-16
3last month
1last week
Acq. date: 2026-04-05
Citations