Publication:
NBTI in Si0.55Ge0.45 cladding p-FinFETs: porting the superior reliability from planar to 3D architectures
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1875 since deposited on 2021-10-22
1last month
Acq. date: 2026-04-05
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Statistics
Views
1875 since deposited on 2021-10-22
1last month
Acq. date: 2026-04-05
Citations