Publication:
NBTI in Si0.55Ge0.45 cladding p-FinFETs: porting the superior reliability from planar to 3D architectures
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1871 since deposited on 2021-10-22
Acq. date: 2025-12-15
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Views
1871 since deposited on 2021-10-22
Acq. date: 2025-12-15
Citations