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Gate induced floating body effect behavior in uniaxially strained SOI nMOSFETs
Publication:
Gate induced floating body effect behavior in uniaxially strained SOI nMOSFETs
Date
2009
Proceedings Paper
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19750.pdf
7.64 MB
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Agopian, Paula G.D.
;
Pacheco, Vinicius H.
;
Martino, Joao A.
;
Simoen, Eddy
;
Claeys, Cor
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Abstract
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1921
since deposited on 2021-10-17
Acq. date: 2025-10-28
Citations
Metrics
Views
1921
since deposited on 2021-10-17
Acq. date: 2025-10-28
Citations