Publication:

Resistive switching-like behaviour of the dielectric breakdown in ultra-thin Hf based gate stacks in mosfets

Date

Loading...
Thumbnail Image

Abstract

Description

Statistics

Views

1925 since deposited on 2021-10-18
2last month
1last week
Acq. date: 2026-08-05

Citations

Statistics

Views

1925 since deposited on 2021-10-18
2last month
1last week
Acq. date: 2026-08-05

Citations