Skip to content
Institutional repository
Communities & Collections
Browse all items
Scientific publications
Open knowledge
Log In
imec Publications
Articles
Partial scan and symbolic test at the register-transfer level
Publication:
Partial scan and symbolic test at the register-transfer level
Copy permalink
Date
1995
Journal article
Simple item page
Full metadata
Statistics
Loading...
Loading...
Files
874.pdf
575.66 KB
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Steensma, Johannes
;
Catthoor, Francky
;
De Man, Hugo
Journal
Journal of Electronic Testing
Abstract
Description
Metrics
Views
1929
since deposited on 2021-09-29
1
last month
Acq. date: 2025-12-15
Citations
Metrics
Views
1929
since deposited on 2021-09-29
1
last month
Acq. date: 2025-12-15
Citations