Publication:

Impact of Relaxation on the Performance of GeSe True Random Number Generator Based on Ovonic Threshold Switching

Date

2022
Journal article
https://doi.org/10.1109/LED.2022.3179590
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dc.contributor.authorZhou, Xue
dc.contributor.authorHu, Zeyu
dc.contributor.authorChai, Zheng
dc.contributor.authorZhang, Weidong
dc.contributor.authorClima, Sergiu
dc.contributor.authorDegraeve, Robin
dc.contributor.authorZhang, Jian Fu
dc.contributor.authorFantini, Andrea
dc.contributor.authorGarbin, Daniele
dc.contributor.authorDelhougne, Romain
dc.contributor.authorGoux, Ludovic
dc.contributor.authorKar, Gouri Sankar
dc.contributor.imecauthorClima, Sergiu
dc.contributor.imecauthorDegraeve, Robin
dc.contributor.imecauthorFantini, Andrea
dc.contributor.imecauthorGarbin, Daniele
dc.contributor.imecauthorDelhougne, Romain
dc.contributor.imecauthorGoux, Ludovic
dc.contributor.imecauthorKar, Gouri Sankar
dc.contributor.orcidimecClima, Sergiu::0000-0002-4044-9975
dc.contributor.orcidimecFantini, Andrea::0000-0002-3220-8856
dc.contributor.orcidimecGarbin, Daniele::0000-0002-5884-1043
dc.contributor.orcidimecGoux, Ludovic::0000-0002-1276-2278
dc.contributor.orcidimecDegraeve, Robin::0000-0002-4609-5573
dc.contributor.orcidimecDelhougne, Romain::0009-0009-0129-709X
dc.date.accessioned2022-11-10T15:35:45Z
dc.date.available2022-08-20T02:37:25Z
dc.date.available2022-11-10T15:35:45Z
dc.date.embargo2023-03-31
dc.date.issued2022
dc.description.wosFundingTextThis work was supported in part by the National Natural Science Foundation of China under Grant 62104188; in part by the Major Key Project of Peng Cheng Laboratory (PCL) under Grant PCL2021A12; and in part by the Engineering and Physical Sciences Research Council (EPSRC), U.K., under Grant EP/M006727/1 and Grant EP/S000259/1.
dc.identifier.doi10.1109/LED.2022.3179590
dc.identifier.issn0741-3106
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/40285
dc.publisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
dc.source.beginpage1061
dc.source.endpage1064
dc.source.issue7
dc.source.journalIEEE ELECTRON DEVICE LETTERS
dc.source.numberofpages4
dc.source.volume43
dc.title

Impact of Relaxation on the Performance of GeSe True Random Number Generator Based on Ovonic Threshold Switching

dc.typeJournal article
dspace.entity.typePublication
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