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Modelling and mitigation of time-zero variability in sub-16nm FinFET-based STT-MRAM memories
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Modelling and mitigation of time-zero variability in sub-16nm FinFET-based STT-MRAM memories
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Date
2014
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Hartmann, Matthias
;
Kukner, Halil
;
Agrawal, Prashant
;
Raghavan, Praveen
;
Van der Perre, Liesbet
;
Dehaene, Wim
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1917
since deposited on 2021-10-22
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Acq. date: 2025-12-15
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Metrics
Views
1917
since deposited on 2021-10-22
1
last month
Acq. date: 2025-12-15
Citations